OJONUGWA DANIEL, Thomas; ESSANG UNO, Uno; UTHMAN ISAH, Kasim; AHMADU, Umaru. Structural and microstructural study of SnS thin film semiconductor of 0.2. International Journal of Physical Research, [S. l.], v. 7, n. 1, p. 26–36, 2019. DOI: 10.14419/ijpr.v7i1.27700. Disponível em: https://sciencepubco.com/index.php/IJPR/article/view/27700.. Acesso em: 21 nov. 2024.