Design & Optimization of Gate-All-Around Tunnel FET for Low Power Applications

  • Authors

    • Umesh Dutta MANAV RACHNA INTERNATIONAL INSTITUTE OF RESEARCH & STUDIES
    • M K. Soni MANAV RACHNA INTERNATIONAL INSTITUTE OF RESEARCH & STUDIES
    • Manisha Pattanaik ABV-IIITM Gwalior
    2018-09-17
    https://doi.org/10.14419/ijet.v7i4.12352
  • TFET, Technology Computer-Aided Design Simulation (TCAD), Band to Band Tunneling (BTBT), Subthreshold Slope, High-K Dielectric, Am bipolar Current.
  • This paper investigates the performance of tri material gate tunnel field effect transistor (TMGTFET) device designed in gate all around (GAA) configuration. The device performance is analyzed by varying various device related parameters like: drain doping, oxide thickness and radius of silicon core. Simulations are performed using technology computer-aided design (TCAD) tool at 60 nm gate length. Simulation results show that the performance of TMGTFET device can be optimized by proper selection of device parameters so as to achieve improvements in the ON current, OFF current, sub-threshold swing and ambipolar current. The silicon based TMGTFET device demonstrates good performance which makes it a suitable candidate for low power applications with ON current of 0.386 µA/µm, average sub-threshold swing of 32.06 mV/decade, maximum current gain cut off frequency of 41.4 GHz and extremely low OFF current value of the order of 10-20A/µm. We have performed the device optimization to boost the ON current and improve the sub-threshold slope in order to make sure that this device configuration becomes suitable for both low power and high performance applications. The proposed hetero dielectric tri material gate tunnel FET device (HD-TFET) designed in gate all around configuration achieves 19.7 times improvement in ON current as compared to TMGTFET device and excellent average sub-threshold swing of 21.2 mV/decade. The maximum unity current gain frequency is also improved by 3 times indicating its potential for deployment in high frequency applications.

     

  • References

    1. [1] A. C. Seabaugh, and Q. Zhang, “Low-Voltage Tunnel Transistors for Beyond CMOS Logic,†Proceedings of the IEEE, vol.98, no. 12, pp. 2095-2110,Dec.2010. https://doi.org/10.1109/JPROC.2010.2070470.

      [2] Seongjae Cho, Jae Sung Lee, Kyung Rok Kim, Byung-Gook Park, James S. Harris and In Man Kang, “Analyses on Small – Signal Parameters and Radio-Frequency Modeling of Gate-All-Around Tunneling Field Effect Transistors,†IEEE Transactions on Electron Devices,vol.58,no.12,pp.4164-4171,Dec.2011. https://doi.org/10.1109/TED.2011.2167335.

      [3] K. Boucart, and A. M. Ionescu, “Double-Gate Tunnel FET with High-k Gate Dielectric,†IEEE Trans. on Electron Devices, vol.54, no.7,pp.1725-1733,Jul.2007. https://doi.org/10.1109/TED.2007.899389.

      [4] R. Jhaveri, V. Nagavarapu, and J.C.S. Woo, “Effect of Pocket Doping and Annealing Schemes on the Source- Pocket Tunnel Field- Effect Transistor,†IEEE Trans. on Electron Devices, vol. 58, no. 1, pp. 80-86, Jan. 2011. https://doi.org/10.1109/TED.2010.2089525.

      [5] Giovanni Betti Beneventi, Elena Gnani, Antonio Gnudi, Susanna Reggiani and Giorgio Baccarani, “Dual-Metal-Gate InAs Tunnel FET With Enhanced Turn-On Steepness and High ON-Current,†IEEE Transactions on Electron Devices, vol.61, no.3, pp.776-784, Mar. 2014. https://doi.org/10.1109/TED.2014.2298212.

      [6] R. Jhaveri, V. Nagavarapu, and J.C.S. Woo, “Effect of Pocket Doping and Annealing Schemes on the Source- Pocket Tunnel Field- Effect Transistor,†IEEE Trans. on Electron Devices, vol. 58, no. 1, pp. 80-86, Jan. 2011. https://doi.org/10.1109/TED.2010.2089525.

      [7] H. Liu, S. Dutta, III-V Tunnel FET model manual, 2015,[online]Available:https://nanohub.org/publications/12/2.

      [8] S. Agarwal, G. Klimeck, and M. Luisier, “Leakage- Reduction Design Concepts for Low-Power Vertical Tunneling Field- Effect Transistors,†IEEE Electron Device Letters, vol. 31, no. 6, pp. 621-623, Jun. 2010. https://doi.org/10.1109/LED.2010.2046011.

      [9] Dawit B.Abdi and M.Jagadesh Kumar, “Controlling Ambipolar Current in Tunneling FET’s using Overlapping Gate-on Drain,†Journal of the Electron Devices Society, vol.2, no.6, pp.187-190, Nov. 2014. https://doi.org/10.1109/JEDS.2014.2327626.

      [10] C. Anghel, Hraziia, A. Gupta, A. Amara and A. Vladimirescu,“30-nm Tunnel FET With Improved Performance and Reduced Ambipolar Current,†IEEE Trans. on Electron Devices, vol. 58, no. 6,pp.1649-1654,Jun.2011. https://doi.org/10.1109/TED.2011.2128320.

      [11] Jun-Sik Yoon, Kihyun Kim, Taiuk Rim and Chang-Ki Baek, “Performance and Variations Induced by Single Interface Trap of Nanowire FET’s at 7-nm Node,†IEEE Transactions on Electron Devices,vol.64,no.2,pp.339-344,Feb2017. https://doi.org/10.1109/TED.2016.2633970.

      [12] Chunsheng Jiang, Renrong Liang and Jun Xu, “Investigation of Negative Capacitance Gate-all-around Tunnel FET’s Combining Numerical Simulation and Analytical Modeling,†IEEE Transactions on Nanotechnology, vol.16, issue 1, pp.58-67, Jan 2017.

      [13] Jae Sung Lee, Jae Hwa Seo, Seongjae Cho, Jung- Hee Lee, Shin-won Kang, Jin-Hyuk Bae, Eou-sik Cho and In Man Kang, “Simulation study on effect of drain underlap in gate-all-around tunneling field-effect transistors,†2013, Current Applied Physics,13(6), pp. 1143-1149. https://doi.org/10.1016/j.cap.2013.03.012.

      [14] A. Zhang, J. Mei, L. Zhang, H. He, J. He and M. Chan, "Numerical study on dual material gate nanowire tunnel field-effect transistor", IEEE International Conference on Electron Devices and Solid State Circuit (EDSSC), 2012, pp.1 - 5.

      [15] Z. X. Chen, H. Y. Yu, N. Singh, N. S. Shen, R. D. Sayanthan, G. Q. Lo and D. L. Kwong, "Demonstration of Tunneling FETs Based on Highly Scalable Vertical Silicon Nanowires," IEEE Electron Device Lett.,vol.30,no.7,pp.754-756,Jul.2009. https://doi.org/10.1109/LED.2009.2021079.

      [16] Hao Wang, Sheng Chang, Yue Hu, Hongyu He, Jin He, Qijun Huang, Frank He and Gaofeng Wang, “A Novel Barrier Controlled Tunnel FET,†IEEE Electron Device Letters, vol.35, no.7, pp.798-800, Jul. 2014. https://doi.org/10.1109/LED.2014.2325058.

      [17] Kuo-Hsing Kao, Anne S. Verhulst, William G. Vandenberghe, Bart Soree, Guido Groeseneken and Kristin De Meyer, “Direct and Indirect Band-to-Band Tunneling in Germanium-Based TFET’s,†IEEE Transactions on Electron Devices, vol.59, no.2, pp.292-300, Feb.2012. https://doi.org/10.1109/TED.2011.2175228.

      [18] Umesh Dutta, M.K.Soni, Manisha Pattanaik, "Design and Analysis of Tunnel FET for Low Power High Performance Applications", International Journal of Modern Education and Computer Science (IJMECS),vol.10,no.1,pp.65-73. https://doi.org/10.5815/ijmecs.2018.01.07.

      [19] Qin Zhang, Wei Zhao and Alan Seabaugh, “Low-Subthreshold-Swing Tunnel Transistors,†IEEE Electron Device Letters, vol.27, no.4, pp. 297-300, April.2006.

      [20] Shylendra Ahish, Dheeraj Sharma, Yernad Balachandra, Nitin Kumar and Moodabettu Harishchandra Vasantha, “Performance Enhancement of Novel InAs/Si Hetero Double-Gate Tunnel FET Using Gaussian Doping,†IEEE Transactions on Electron Devices, vol.63,no.1,pp.288-295,Jan.2016. https://doi.org/10.1109/TED.2015.2503141.

      [21] Rakhi Narang, Manoj Saxena, R. S. Gupta, Mirdula Gupta, “Drain current model for a gate all around (GAA) p-n-p-n tunnel FETâ€, Micro-electronics Journal,44 (2013) 479-488, May. https://doi.org/10.1016/j.mejo.2013.04.002.

      [22] Madan J and Chaujar R “Numerical Simulation of N + Source Pocket PIN-GAA-Tunnel FET: Impact of Interface Trap Charges and Temperature,†IEEE Trans. Electron Devices, vol.64, no.4, pp.1482–88, April 2017. https://doi.org/10.1109/TED.2017.2670603.

      [23] J. Madan, R. Chaujar, Interfacial charge analysis of heterogeneous gate dielectric-gate all around-tunnel FET for improved device reliability, IEEE Trans. Device Mater. Reliab.16 (2016) 227-234. https://doi.org/10.1109/TDMR.2016.2564448.

      [24] V. Saripalli, S. Datta, V. Narayanan, and J. P. Kulkarni, “Variation-tolerant ultra-low-power heterojunction tunnel FET SRAM design,†IEEE/ACM International Symposium on Nanoscale Architectures, pp. 45-52, Jun. 2011.

      [25] Navlakha N, Lin JT, Kranti A, “Retention and Scalability Perspective of Sub-100-nm Double Gate Tunnel FET DRAM,â€IEEE Transactions on Electron Devices, vol.64, no.4, pp.1561-1567, April 2017. https://doi.org/10.1109/TED.2017.2662703.

      [26] G. V. Luong, S. Strangio, A. Tiedemannn, S. Lenk, S. Trellenkamp, K.Bourdelle, Q.-T.Zhao, and S.Mantl, “Experimental Demonstration of Strained Si Nanowire GAA n-TFETs and Inverter Operation with Complementary TFET Logic at Low Supply Voltages,†Solid-State Electronics,vol.115,pp.152–159,2016. https://doi.org/10.1016/j.sse.2015.08.020.

      [27] Safa S, Noor SL, Khan ZR, “Physics-Based Generalized Threshold Voltage Model of Multiple Material Gate Tunneling FET Structure,†IEEE Transactions on Electron Devices, vol. 64, no.4, pp. 1449-1454, April 2017. https://doi.org/10.1109/TED.2017.2662580.

      [28] S. Mookerjea, R. Krishnan, S. Datta, V. Narayanan, on enhanced Miller capacitance effect in interband tunnel transistors, IEEE Elec

      tron Device Lett. 30(2009) 1102-1104. https://doi.org/10.1109/LED.2009.2028907.

      [29] W. Cao, C. J. Yao, G. F. Jiao, D. Huang, H. Y. Yu and M. F. Li, “Improvement in Reliability of Tunneling Field-Effect Transistor With p-n-i-n Structure,†IEEE Trans. on Electron Devices, vol. 58, no.7,pp.2122-2126,Jul.2011. https://doi.org/10.1109/TED.2011.2144987.

      [30] Pandey, Rahul, Saurabh Mookerjea, and Suman Datta, “Opportunities and Challenges of Tunnel FETs,†IEEE Transactions on Circuits and Systems I: Regular Papers, vol.63, no.12, pp.2128-2138, Dec. 2016. https://doi.org/10.1109/TCSI.2016.2614698.

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  • How to Cite

    Dutta, U., K. Soni, M., & Pattanaik, M. (2018). Design & Optimization of Gate-All-Around Tunnel FET for Low Power Applications. International Journal of Engineering & Technology, 7(4), 2263-2270. https://doi.org/10.14419/ijet.v7i4.12352