Achievement of Traceability for DC Voltage and Current Measurements up to 5 kV and 1 A
-
2018-12-05 https://doi.org/10.14419/ijet.v7i4.13673 -
DC Voltage and Current Measurements, Multifunction Calibrator, Voltage Divider, Traceability, JVS, Expanded Uncertainty. -
Abstract
National Institute of Standards is the National Metrology Institute of Egypt, which realizes units of measurements according to the Interna-tional System of Units. The DC Josephson Voltage Standard is used as a primary standard to reproduce the unit of volt and provide tracea-bility of measurements to the SI units. JVS, Zener diode reference standards, standard resistors, multifunction calibrators and voltage divid-ers of NIS maintain the DC voltage & current and provide the traceability to all Egyptian industrial governmental and private sectors. In this paper, the measurements' traceability of DC voltages from 10 mV up to 5 kV and DC currents from 100 μA up to 1 A has been achieved. In this method, the Fluke 5720A multifunction calibrator has been calibrated in its DC voltage and current functions to cover the range of 1 kV and 1 A. To extend the voltage range to 5 kV, a universal high voltage divider has been used. The DC voltage calibrations have been performed using a Fluke 732B Zener diode reference standard, which is traceable to International System of Units via the NIS DC voltage primary standard. Relevant DC voltage and current measurements, associated with their expanded uncertainties, are presented in this work.
Â
Â
-
References
[1] Dietmar Drung, Martin Götz, EckartPesel, and Hansjörg Scherer, "Improving the Traceable Measurement and Generation of Small Direct Currents,"IEEE transactions on instrumentation and measurement, vol. 64, no. 11, November 2015. https://doi.org/10.1109/TIM.2015.2440564.
[2] R. Hadi Sardjono, BambangSuprianto, “Establishing the Traceability of DC Voltage Quantity in the Electrical Metrology Laboratory of Research Center. KIM-LIPI,†Mapan, June 2015, Volume 30, Issue 2, pp 145–153. https://doi.org/10.1007/s12647-014-0125-x.
[3] S.P. Benz and C. Hamilton, Application of Josephson effect to voltage metrology, Proc. IEEE, Vol. 15 (10), pp. 1617-1629, 2004. https://doi.org/10.1109/JPROC.2004.833671.
[4] M. Schubert, T. May, G. Wende, H.-G. Meyer, A cross-type SNS junction array for a quantum-based arbitrary waveform synthesizer, IEEE Trans. Appl. Supercond.15 (2) (2005) 829–832. https://doi.org/10.1109/TASC.2005.850072.
[5] Hala M. Abdel Mageed, Ali M. El-Rifaie, Electrical metrology applications of LabVIEW software, J. Software Eng. Appl. (2013), pp.113–120.
[6] Hala M. Abdel Mageed , "A new automatic system for calibrating the solid state DC voltage reference standards at NIS, Egypt," MAPAN-Journal of Metrology Society of India, Vol. 26, Issue 4, December 2011, pp 329–337.
[7] Hala M. Abdel Mageed, Ali M. El-Rifaie, Electrical quantities in terms of the international system of units, in: Processing World Congress on Engineering 2013 Conference, 3–5 July, London, UK.
[8] S Solve, R Chayramy, M Stock, Hala M Abdel Mageed, Omar M Aladdin, M Helmy A Raouf, “Bilateral Comparison of 1 V and 10 V Standards between the NIS (Egypt) and the BIPM, August to September 2014 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b),†Metrologia, Vol. 52, Jan. 2015
[9] Beat Jeckelmann, Hani Saad Abdel Aziz, Edyta Dudek, Damir Ilic, Ivan Lenicek, Nadia Nassif Tadros, Marcin Orzepowski and Andrey Tenev, " RMO key comparison EURAMET.EM-K2.1: Comparison of resistance standards at 10 MΩ and 1 GΩ," Metrologia, Vol. 50, 2013
[10] Guide to the Expression of uncertainty in measurement (GUM), corrected and re-print1995, International Organization for Standardization (ISO), Geneva, Switzerland. 1995.
[11] V.N. Ojha, Evaluation and expression of uncertainty of measurement, MAPAN-Journal of Metrology Society of India, vol. 13 (1), pp. 71-84, 1998.
[12] Hala M. Abdel Mageed, and Faisal Q Alenezi, "Traceability of DC and AC high voltage measurements using voltage divider calibration," International Journal of Electrical Engineering Education, https://doi.org/10.1177/0020720918754832.
[13] Hala M. Abdel Mageed, Ali M. El-Rifaie, and Omar M. Aladdin, "Traceability of DC high voltage measurements using the Josephson voltage standard," Measurement, Vol. 58, 2014, pp. 269–273. https://doi.org/10.1016/j.measurement.2014.08.029.
-
Downloads
-
How to Cite
M.Abdelmegeed, H., Halawa, M., & M. Aladdin, O. (2018). Achievement of Traceability for DC Voltage and Current Measurements up to 5 kV and 1 A. International Journal of Engineering & Technology, 7(4), 3766-3769. https://doi.org/10.14419/ijet.v7i4.13673