Input Bridging Fault and Non Feedback Bridging Fault Detection and Test Vector Generation by Boolean Satisfiability Method

  • Authors

    • K Sarvani
    • B Viswanathan
    2018-07-20
    https://doi.org/10.14419/ijet.v7i3.12.16105
  • Boolean Satisfiability, Input Bridging Fault, Non Feedback Bridging Fault, Test Vectors.

  • The input bridging faults and non feedback bridging fault( short between lines) occurs due to improper soldering.This paper enumerates the Fault detection and high quality test vector generation for these faults by using Boolean Satisfiability method with the help of JAVA code.This method can be adapted to deal with many faults in the combinational circuits.

     

     

  • References

    1. [1] Michele Favalli and Marcello Dalpasso “Boolean and PseudoBoolean Test Generation for Feedback Bridging Faults†IEEE Trans on Computers, VOL. 65, NO. 3, MARCH 2016

      [2] Soumitrakumarmandal,â€Digital electronics principles and applications†Tata Mc GrawHill private limited ,New Delhi

      [3] T. Larrabee, “Test pattern generation using Boolean satisfiabilityâ€IEEE Trans. Comput.-Aided Design Integr. Circuits Syst., vol. 11,no. 1, pp. 4–15, Jan. 1992.

      [4] R. Drechsler, et al., “Test Generation Using Boolean Proof Enginesâ€.New York, NY, USA: Springer Verlag, 2009.

      [5] M. Favalli and M. Dalpasso, “How many test vectors we need to detect a bridging fault?†J. Electron. Testing, vol. 25, no. 1, pp. 79–95, 2009.

      [6] Chih-Ang Chen and Sandeep K. Gupta, “Satisfiability-Based Test Generatorfor Path Delay Faults in Combinational Circuits “Design Automation Conference Proceedings 1996.

      [7] A. Biere, M. Heule, H. V. Mareen, and T. Walsh, Eds.,â€Handbook of Satisfiability.†Amsterdam, The Netherlands: IOS Press, 2009.

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  • How to Cite

    Sarvani, K., & Viswanathan, B. (2018). Input Bridging Fault and Non Feedback Bridging Fault Detection and Test Vector Generation by Boolean Satisfiability Method. International Journal of Engineering & Technology, 7(3.12), 354-356. https://doi.org/10.14419/ijet.v7i3.12.16105