A New Hybrid Test Pattern Generator for Stuck-at â€“Fault and Path Delay Fault in Scan Based Bist
Keywords:built-in self-test, stuck-at faults, delay faults, test point insertion.
Testing for delay and stuck-at faults needs a pattern of two checks and test sets square measure sometimes more. Built self-test (BIST) schemes square measure enticing for such comprehensive testing. The BIST check pattern generators (TPGs) for such testing ought to be designed accustomed guarantee high pattern-pair coverage. Within the planned work, necessary and decent conditions to complete/ supreme pattern-pair coverage for consecutive circuit has been derived. A replacement check data-compression theme that's a hybrid approach between external testing and inbuilt self-test (BIST) is analyzed. The planned approach is predicated on weighted pseudorandom testing and uses a unique approach for pressing and storing the load sets. Most existing check generation tools square measure either inefficient in mechanically characteristic the longest checkable methods thanks to the high process complexness or don't support at speed test mistreatment existing sensible design-for-testability structures, like scan style. During this work a check generation methodology for scan-based synchronous consecutive circuits is conferred, below 2 at-speed check methods employed in trade. The approach provides a balanced trade-off between accuracy and potency. Experimental results show promising runtime and fault coverage enhancements over existing ways.
 Dong X, Xiao QW & Laung TW, â€œLow-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom Test Pattern Generation and Reseedingâ€, IEEE transaction on very large scale integration (VLSI) systems, (2016).
 Abu-Issa AS & Quigley SF, â€œBit-swapping LFSR and scan-chain ordering: A novel technique for peak- and average-power reduction in scan-based BISTâ€, IEEE Trans. Computer Aided Design. Integration. Circuits System, Vol.28, No.5, (2009), pp.755â€“759.
 Banerjee S, Chowdhury DR & Bhattacharya BB, â€œAn efï¬cient scan tree design for compact test pattern setâ€, IEEE Trans. Computer Aided Design. Integration. Circuits Systems, Vol.26, No.7, (2007), pp.1331â€“1339.
 B Kassimbekova, G Tulekova, V Korvyakov (2018). Problems of development of aesthetic culture at teenagers by means of the Kazakh decorative and applied arts. OpciÃ³n, AÃ±o 33. 170-186
 Basturkmen NZ, Reddy SM & Pomeranz I, â€œA low power pseudorandom BIST techniqueâ€, J. Electron. Test., Theory Application, Vol.19, No.6, (2003), pp.637â€“644.
 Chatterjee M & Pradhan DK, â€œA BIST pattern generator design for near-perfect fault coverageâ€, IEEE Transaction. Computer, Vol.52, No.12, (2003), pp.1543â€“1558.
 Hellebrand S, Rajski J, Tarnick S, Venkataraman S & Courtois B, â€œBuilt-in test for circuits with scan based on reseeding of multiple polynomial linear feedback shift registersâ€, IEEE Transaction. Computer, Vol.44, No.2, (1995), pp.223â€“233.
 G Abilbakieva, M Knissarina, K Adanov, S Seitenova, G Bekeshova (2018). Managerial competence of future specialists of the education system (Preschool education and upbringing) and medicine in the comparative aspect. OpciÃ³n, AÃ±o 33, No. 85. 44-62.
 Kiefer G & Wunderlich HJ, â€œDeterministic BIST with multiple scan chainsâ€, J. Electron. Test., Vol.14, No.1, (1999), pp.85â€“93.
 Li L & Chakrabarty K, â€œTest set embedding for deterministic BIST using a reconï¬gurable interconnection networkâ€, IEEE Transaction. Computer. Aided Design. Integration. Circuits Syst., Vol.23, No.9, (2004), pp.1289â€“1305.
 Chih AC, Sandeep KK, â€œBIST Test Pattern Generators for Stuck-Open and Delay Testingâ€, IEEE Transaction, (1994).
 Slawomir P & Alicja P, â€œBIST and Delay Fault Detectionâ€, International test conference, (1993).
 Patrick G, Christian L, Serge P & Arnaud V, â€œComparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-at and Bridging Faultsâ€, 6th IEEE International Conference on On-Line Testing Workshop, (2000), pp. 121-126.