Certification of the Rough Resonance by the Wave Site of Matter for Welter Point on the Alteration Recognition System

  • Authors

    • Jeong lae Kim
    • Kyu dong Kim
    2018-08-29
    https://doi.org/10.14419/ijet.v7i3.33.18583
  • sparkle recognition rate, wave recognition gestalt, welter recognition system, welter resonance.

  • Wave alteration technology is formatted the resonance status for point-star pattern of the sparkle recognition rate (SRR) and vacuum recognition rate (VRR) on the wave recognition gestalt. The recognition rate condition by the wave recognition gestalt is associated with the welter resonance system. As to investigate a point-star pattern of the rough alteration, we are formatted of the wave value with wave layer point by the welter-down structure. The concept of recognition rate is made sure of the reference of sparkle rate and vacuum rate for alteration signal by the wave resonance gestalt. Moreover to appear a rough alteration of the SRR-VRR of the medium in terms of the wave-resonance gestalt, and wave point resonance that is gained the a wave value of the far alteration of the Wa-rm-FA-σMEX-MED with 12.03±2.28 units, that was the a wave value of the convenient alteration of the Wa-rm-CO-σMEX-MED with 2.71±0.51 units, that was the a wave value of the flank alteration of the Wa-rm-FL-σMEX-MED with 1.41±0.19 units, that was the a wave value of the vicinage alteration of the Wa-rm-VI-σMEX-MED with 0.22±0.10 units. The welter resonance will be to assess at the ability of the wave-resonance gestalt for the control degree recognition rate on the SRR-VRR that is clarified the rough sparkle and vacuum gestalt by the recognition rate system. Welter recognition system will be conjecture of a gestalt by the special signal and to count a wave data of welter resonance rate.

     

     

  • References

    1. [1] Omiotek Z. (2011), The study of the self-similarity measurement of the images by fractal analysis (in polish), Barometr Regionalny, 23(1), 93–105.

      [2] Brown, S.R. (1987), A note on the description of surface roughness using fractal dimension. Geophys. Res. Lett., 14 (11), 1095–1098.

      [3] Dannenberg R. (2004), Quantitative comparison of lineal analysis to box counting analysis of a real microtexture., Harmon Fract Image Anal, 50–60.

      [4] Carr, J.R., Benzer, W.B. (1991), On the practice of estimating fractal dimension. Math. Geol., 23 (7), 945–958.

      [5] Kim, K.D., Kim, J.L., Yu. Y.M. (2013), A Study on the Influence of Mobile Commerce Characteristics Perception on Mobile Shopping Intentions, The Journal of IIBC, 13(6), 297-303.

      [6] Kim, J.L., Hwang, K.S. (2015), Study of quake wavelength of dynamic movement with posture, International Journal of Advanced Smart Convergence, 4(1), 99-103.

      [7] Kim, J.L., Kim, K.D. ) (2017), Prediction of shiver differentiation by the form alteration on the stable condition, International Journal of Internet Broadcasting and Communication, 9(4), 8-13.

      [8] Kim, J.L., Kim, H.J. (2017), A Study of structure modeling of the stratum corneum on the hydration, Journal of the Convergence on Culture Technology, 3(3), 31-36.

      [9] Huiting J, Flisijn H, Kokkeler ABJ, Smit GJM. (2013), Exploiting phase measurements of EPC Gen2 RFID structures. IEEE Int Conf RFID-Technol Appl (RFID-TA), 1–6.

      [10] Bekkali A, Zou SC, Kadri A, Crisp M, Penty RV. (2015), Performance analysis of passive UHF RFID systems under cascaded fading channels and interference effects. IEEE Trans Wirel Commun., 14(3), 1421–33.

      [11] DiGiampaolo E, Martinelli F. (2014), Mobile robot localization using the phase of passive UHF RFID signals. IEEE Trans Ind Electron, 61(1), 365–76.

      [12] López Y. Ã., Gómez M.E., Andrés F.L.H. (2017), A received signal strength RFID-based indoor location system, Sensors and Actuators A 255, 118–133.

      [13] Chawla K., McFarland C., Robins G., Shope C. (2013), Real-time RFID localization using RSS, in: 2013 International Conference on Localization and GNSS (ICL-GNSS), Turin (Italy), (25–27 June), 1–6.

  • Downloads

  • How to Cite

    lae Kim, J., & dong Kim, K. (2018). Certification of the Rough Resonance by the Wave Site of Matter for Welter Point on the Alteration Recognition System. International Journal of Engineering & Technology, 7(3.33), 98-101. https://doi.org/10.14419/ijet.v7i3.33.18583