Surface Defect Detection using Novel Histogram Distance-based Multiple Template Anomalies Detection Algorithm

  • Authors

    • Ze-Hao Wong
    • C. M. Thong
    • W. M. Edmund Loh
    • C. J. Wong
    2019-12-24
    https://doi.org/10.14419/ijet.v7i4.14.27693
  • Histogram distance, Multiple templates, Referential method, Surface Defect Detection

  • Surface defects in manufacturing are top challenges in various manufacturing field including LED manufacturing, die manufacturing and printing industry. Quality control through automated surface defect detection has been an emphasis to speed up the production without jeopardizing the quality of the product. However, complexity and flexibility in product design, specification and dataset availability posted challenges in existing referential-based algorithm. Golden template-based algorithms are sensitive to misalignment and product variations. Deep learning and its variant can be used as non-linear filter to segment anomalies area. However, deep learning requires huge labelled database and consume long learning time. Similarly, maximum likelihood-based algorithms require large database for learning. This research proposes a novel histogram distance based multiple templates anomalies detection (MTAD) algorithm to segment surface defect. Histogram distance based on kernel-wise histograms stacked across illumination normalized database of similar size can describe the degree of anomaly intuitively across the image. Then, surface defect can be justified intuitively according to anomaly heat map generated. The algorithm is tested against industrial samples and it can handle texture and design variation existed in the product while catching anomaly in real time. This research suggests future studies on extending dimensionality of the histogram. Suggested algorithm has wide range of application other than surface defect detection. For examples, video motion detection, decolorization detection on industrial lighting.

     

     

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  • How to Cite

    Wong, Z.-H., M. Thong, C., M. Edmund Loh, W., & J. Wong, C. (2019). Surface Defect Detection using Novel Histogram Distance-based Multiple Template Anomalies Detection Algorithm. International Journal of Engineering & Technology, 7(4.14), 401-405. https://doi.org/10.14419/ijet.v7i4.14.27693