Low power and high fault coverage SIC reseeding TPG using x-filling techniques for Scan BIST
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2017-12-28 
https://doi.org/10.14419/ijet.v7i1.2.9232
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Abstract
This paper has been withdrawn.
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How to Cite
Hussain, S. (2017). Low power and high fault coverage SIC reseeding TPG using x-filling techniques for Scan BIST. International Journal of Engineering & Technology, 7(1.2), 220-224. https://doi.org/10.14419/ijet.v7i1.2.9232Received date: 2018-01-21
Accepted date: 2018-01-21
Published date: 2017-12-28