V. Pavan Kumar, B.; Sri Ashish, P.; Sai Harshitha, K.; Sai Krishna, G.; Anil chowdary, T. Testing Ripple Carry Adder Using Bist Architecture. IJET 2018, 7 (2.7), 834-837. https://doi.org/10.14419/ijet.v7i2.7.11077.