MARIA DOMINIC SAVIO, M; YUVARAJ, S. Attendance marking system using face recognition & RFID and prevention of examination Malpractice system. International Journal of Engineering & Technology, [S. l.], v. 7, n. 2.8, p. 599–602, 2018. DOI: 10.14419/ijet.v7i2.8.10541. Disponível em: https://sciencepubco.com/index.php/ijet/article/view/10541.. Acesso em: 21 nov. 2024.