LEE, Sanggi; KANG, Inje; KIM, Eungyeong; SHON, Kangryul; LIM, Chulsu. A study on improving the quality inspection on national information by using levenshtein distance algorithm. International Journal of Engineering & Technology, [S. l.], v. 7, n. 2.33, p. 161–164, 2018. DOI: 10.14419/ijet.v7i2.33.13876. Disponível em: https://sciencepubco.com/index.php/ijet/article/view/13876.. Acesso em: 24 nov. 2024.