HASHIM, Hashimah; RAFIQ ROSLAN, Muhammad; MOHD YAZID, Ibrahim. Investigation of Annealing Temperature on Vanadium Dioxide Thin Films. International Journal of Engineering & Technology, [S. l.], v. 7, n. 4.18, p. 419–423, 2018. DOI: 10.14419/ijet.v7i4.18.21981. Disponível em: https://sciencepubco.com/index.php/ijet/article/view/21981.. Acesso em: 18 may. 2024.