Z.-H. Wong, C. M. Thong, W. M. Edmund Loh, and C. J. Wong, “Surface Defect Detection using Novel Histogram Distance-based Multiple Template Anomalies Detection Algorithm”, IJET, vol. 7, no. 4.14, pp. 401–405, Dec. 2019, doi: 10.14419/ijet.v7i4.14.27693.