Al, Ahmad Hadi, and Nurul Syafiqah Pauzi. “Characterization of Cr Ag Bi-Layer Thin Metal Contacts Sputter Deposited on N-Type Si Semiconductor”. International Journal of Engineering & Technology 7, no. 4.30 (November 30, 2018): 326–329. Accessed November 24, 2024. https://sciencepubco.com/index.php/ijet/article/view/22301.