HASIM, H.; SULTAN, S. M.; MOHAMAD, A. Temperature analysis of ZnO/p-Si heterojunction using thermionic emission model. International Journal of Engineering & Technology, [S. l.], v. 7, n. 4, p. 3022–3025, 2018. DOI: 10.14419/ijet.v7i4.21533. Disponível em: https://sciencepubco.com/index.php/ijet/article/view/21533.. Acesso em: 22 nov. 2024.