Hussain, Sabir. “Low Power and High Fault Coverage SIC Reseeding TPG Using X-Filling Techniques for Scan BIST”. International Journal of Engineering & Technology 7, no. 1.2 (December 28, 2017): 220–224. Accessed May 6, 2024. https://sciencepubco.com/index.php/ijet/article/view/9232.